Modeling With RTS Noise Characterization of Novel Embedded Photogate Single-Photon Avalanche Diode for Circuit Simulations

Single-photon avalanche diodes (SPADs) are widely used for weak light detection due to their high gain and sensitivity. Unfortunately, SPAD devices have random telegraph signal (RTS) noise during the transition phase, which makes circuit design more difficult. Therefore, modeling of RTS in is great significance processing circuits. However, not included traditional equivalent model. In response above problems, this paper implements an model with based on Cadence. The built basic components library, it has strong application universality. validated a novel embedded photogate device (EP-SPAD). It accurately simulates IV characteristics EP-SPAD device. addition, threshold voltage operating Geiger mode precisely defined noise. When reverse bias increased from 0 V 15 V, consistent